MODIFICATION OF TRANSITION'S FACTOR IN THE COMPACT SURFACE-POTENTIAL- BASED MOSFET MODEL

  • Tijana Kevkić Faculty of Sciences and Mathematics
  • Vladica Stojanović Faculty of Sciences and Mathematics
  • Dragan Petković Faculty of Sciences and Mathematics
Keywords: MOSFET modeling, generalized logistic functions, surface potential, quantum mechanical effects,

Abstract


The modification of an important transition’s factor which enables continual behavior of the surface potential in entire useful range of MOSFET operation is presented. The various modifications have been made in order to obtain an accurate and computationally efficient compact MOSFET model. The best results have been achieved by introducing of the generalized logistic function (GL) in fitting of considered factor. The smoothness and speed of the transition of the surface potential from the depletion to the strong inversion region can be controlled in this way. The results of the explicit model with this GL functional form for transition's factor have been verified extensively with the numerical data. A great agreement was found for a wide range of substrate doping and oxide thickness. Moreover, the proposed approach can be also applied on the case where quantum mechanical effects play important role in inversion mode.

Author Biographies

Tijana Kevkić, Faculty of Sciences and Mathematics
Department of Physics
Vladica Stojanović, Faculty of Sciences and Mathematics
Department of Mathematics
Dragan Petković, Faculty of Sciences and Mathematics
Department of Physics

References

Arora, N. D. 1993. MOSFET models for VLSI circuit simulation. Springer-Verlag, New York.

Basu, D., & Dutta, A. 2006. An explicit surface-potential-based MOSFET model incorporating the Quantum mechanical effects. Solid-State Electronics, 50, pp. 1299-1309.

Chaudhry, A., & et al., 2010. Mosfet Models, Quantum Mechanical Effects and Modeling Approaches: A Review.Journal of Semiconductor Technology and Science, 1(10), pp. 20-27.

Chen, T.L., & Gildenblat, G. 2001. Analytical approximation for the MOSFET surface potential. Solid-State Electronics,45, pp. 335-339.

Cunha, A. & et al. 1998. An MOS transistor model for analog circuit design. IEEE Journal of solid-state circuits. 33, 1510-1519.

Eftimie, S., & et al., 2007. MOSFET Model with Simple Extraction Procedures, Suitable for Sensitive Analog Simulations. Romanian Journal of Information Science and Technology, 10, pp. 189-197.

Jukić, D., & Scitovski, R. 2003. Solution of the least-squares problem for logistic function. J. Comput. Appl. Math.,156, pp. 159-177.

Kevkić, T., & Petković, D. 2009. Klasični i kvantnomehanički modeli za površinski potencijal i kapacitivnost MOS strukture u uslovima jake inverzije. . In: Proc. of 53rd ETRAN Conference, V. Banja, Serbia.

Kevkić, T., & Petković, D. 2010. A Quantum Mechanical Correction of Classical Surface Potential Model of MOS Inversion Layer. . In: Proc. Of 27th International Conference on Microelectronics, Niš, Serbia. , pp. 115-118 1.

Kevkić, T., Stojanović, V., & Petković, D. 2015. An analytical surface potential model of MOS inversion layer incorporating the quantum mechanical correction. . In: Proc. of the International Conference of Contemporary materials, Banja Luka.

Kumar, M., & et al., 2007. Approaches to nanoscale MOSFET compact modeling using surface potential based models. . In: 14th International Workshop on the Physics of Semiconductor Devices, Mumbai, India.

Pregaldini, F., & et al., 2004. An advanced explicit surface potential model physically accounting for the quantization effect in deep-submicron MOSFETs. Solid-State Electronics, 48, pp. 427-435.

Stern, F. 1972. Self-Consistent Results for n-Type Si Inversion Layer. Physical Review B, 5(12), pp. 4891-4899.

van Langevelde, R., & Klaassen, F. 2000. An explicit surface-potential-based MOSFET model for circuit simulation.Solid-State Electronics, 44, pp. 409-418.

Published
2016/12/25
Section
Original Scientific Paper