EFFECTIVE IMAGE MODELS FOR INSPECTING PROFILE FLAWS OF CAR MIRRORS WITH APPLICATIONS

  • Yuan-Shyi Peter Chiu Chaoyang University of Technology
  • Yu-Kai Lin Chaoyang University of Technology
  • Hong-Dar Lin Chaoyang University of Technology

Abstract


Since car mirrors are standard accessories with cars, the demands of car mirrors are growing and manufacturers also pay more emphasis on the increase of product quality. Common appearance flaws of car mirrors include: scratches, bubbles, pinholes causing surface flaw type and burrs, damaged edges causing profile flaw type. Currently, the inspection tasks are conducted by human inspectors. Since the profile flaws will cause structural damages of car mirrors and reduce ability to withstand stress, the degree of harm even more than the surface flaws. In additions, the angle diversity of capturing images makes it is not easy to implement automatic optical inspection. Therefore, this study develops an automated profile flaw detection system of car mirrors to replace visual inspection personnel from car mirror inspection tasks. This study proposes a self-contrast defect detection method for the profile flaw inspection of car mirrors. It is not required to provide a standard flawless sample in detection process and derive information compared with testing samples. We first extract the contour information of the testing image by Fourier descriptors. Then, after some middle and high-frequency coefficients were filtered out, an approximated contour image can be rebuilt from the Fourier domain for comparing with the testing image. Finally, the flaw districts are easily separated by image subtraction. Experimental consequences demonstrate that the flaw inspection rate reaches to 85.05%, and the incorrect alert rate is smaller 0.07%, and the correct classification rate is up to 97.47%.

References

Huang, S.H., Pan, Y.C. (2015). Automated visual inspection in the semiconductor industry: A survey. Computer in Industry, 66, 1-10.

Neogi, N., Mohanta, D.K., Dutta, P.K. (2014). Review of vision-based steel surface inspection systems. EURASIP Journal on Image and Video Processing, 50(1), 1-19.

Lin, H.D., Chiu, S.W. (2011). Automated surface micro flaw inspection for quality control of electronic chips. International Journal of the Physical Sciences, 6(23), 5528-5539.

Lin, H., Li, B., Wang, X.G., Shu, Y.F., Niu, S.L. (2019). Automated defect inspection of LED chip using deep convolutional neural network. Journal of Intelligent Manufacturing, 30(6), 2525-2534.

Park, J.K., Kwon, B.K., Park, J.H., Kang, D.J. (2016). Machine learning-based imaging system for surface defect inspection. International Journal of Precision Engineering and Manufacturing-Green Technology, 3(3), 303-310.

Li, D., Liang, L.Q., Zhang, W.J. (2014). Defect inspection and extraction of the mobile phone cover glass based on the principal components analysis. International Journal of Advanced Manufacturing Technology, 73, 1605-1614.

Lin, H.D., Tsai, H.H. (2012). Automated quality inspection of surface defects on touch panels. Journal of the Chinese Institute of Industrial Engineers, 29(5), 291-302.

Chiu, Y.P., Lin, H.D. (2018). Creation of image models for inspecting visual flaws on capacitive touch screens. Journal of Applied Engineering Science, 16(3), 333-342.

Lin, H.D., Chiu, Y.S.P. (2012). Automated flaw detection for lens components. Advanced Science Letters, 17, 114-121.

Lin, H.D., Chen, H.L. (2018). Automated visual fault inspection of optical elements using machine vision technologies. Journal of Applied Engineering Science, 16(4), 447-453.

Chiu, Y.P., Lo, Y.C., Lin, H.D. (2017). Hough transform based approach for surface distortion flaw detection on transparent glass. International Journal of Applied Engineering Research, 12(19), 8150-8159.

Lin, H.D., Hsieh, K.S. (2018). Detection of surface variations on curved mirrors of vehicles using slight deviation control techniques. International Journal of Innovative Computing Information and Control, 14(4), 1407-1421.

Gonzalez, R.C., Woods, R.E. (2008). Digital Image Processing. 3rd Ed., Prentice Hall, New Jersey, USA.

Dawari, V.B., Vesmawala, G.R. (2013). Modal curvature and modal flexibility methods for honeycomb damage identification in reinforced concrete beams. Procedia Engineering, 51, 119-124.

Samet, A., Hui, Y., Souf, M.A.B., Bareille, O., Ichchou, M., Fakhfakh, T., Haddar, M. (2019). Experimental investigation of damage detection in plate-like structure using combined energetic approaches. Proceedings of the Institution of Mechanical Engineers, Part C: Journal of Mechanical Engineering Science, 233(4), 1193-1203.

Liu, J., Shi, Z., Shao, Y. (2017). An investigation of a detection method for a subsurface crack in the outer race of a cylindrical roller bearing. Eksploatacja I Niezawodnosc – Maintenance and Reliability, 19(2), 211–219.

Khoje, S., Bodhe, S. (2012). Performance comparison of Fourier transform and its derivatives as shape descriptors for mango grading. International Journal of Computer Applications, 53(3), 17-22.

Burla, A., Haist, T., Lyda, W., Osten, W. (2011). Fourier descriptors for defect indication in a multiscale and multisensor measurement system. Optical Engineering, 50(4), 043603.

Zheng, Y., Guo, B., Chen, Z., Li, C. (2019). A Fourier descriptor of 2D shapes based on multiscale centroid contour distances used in object recognition in remote sensing images, Sensors, 19(486), 1-19.

Zhang, D., Lu, G. (2002). Shape-based image retrieval using generic Fourier descriptor. Signal Processing: Image Communication, 17, 825-848.

Direkoglu, C., Nixon, M.S. (2011). Shape classification via image-based multiscale descriptions. Pattern Recognition, 44, 2134-2146.

Zhang, D., Lu, G. (2004). Review of shape representation and description techniques. Pattern Recognition, 37, 1-19.

Tsai, D.M., Su, Y.J. (2009). Non-referential, self-compared shape defect inspection for bond pads with deformed shapes. International Journal of Production Research, 47, 1225-1244.

Kunttu, I., Lepisto, L., Rauhamaa, J., Visa, A. (2005). Multiscale Fourier descriptors for defect image retrieval. Pattern Recognition Letters, 27, 123-132.

Otsu, N. (1979). A threshold selection method from gray level histogram. IEEE Transactions on Systems, Man and Cybernetics, 9, 62-66.

Montgomery, D.C. (2013). Statistical Quality Control - A Modern Introduction, 7th Edition, John Wiley & Sons, New York, NY, USA.

Montgomery, D.C., Runger, G.C. (2007). Applied Statistics and Probability for Engineers. 4th Edition, John Wiley & Sons, New Jersey, USA.

Published
2020/02/28
Section
Original Scientific Paper