RESEARCH OF CRITICAL CAUSES OF SOLAR PANEL AGING BASED ON FUZZY FAULT TREE AND PARETO CHART APPROACH

  • Raja Yahmadi University of Carthage, National Institute of Applied Science and Technology (INSAT), Laboratory of Materials, Measurements and Applications, Tunis, Tunisia https://orcid.org/0000-0002-1099-0306
  • Kais Brik University of Carthage, National Institute of Applied Science and Technology (INSAT), Laboratory of Materials, Measurements and Applications, Tunis, Tunisia; University of Manouba, Higher Institute of Multimedia Arts of Manouba (ISAMM), Department of Computer Science, Manouba, Tunisia https://orcid.org/0000-0003-4926-4093
  • Faouzi Ben Ammar University of Carthage, National Institute of Applied Science and Technology (INSAT), Laboratory of Materials, Measurements and Applications, Tunis, Tunisia
Keywords: reliability, fault tree analysis, fuzzy logic method, Pareto chart, photovoltaic panel

Abstract


The photovoltaic (PV) panel represents one of the most widely used means in the renewable energy power generation. In recent years, a comprehensive identification of all degradation modes of the PV panel and their causes, as well as its possible consequences are becoming more and more important to evaluate its reliability and performances in long-term. Using a fuzzy logic framework and Fault Tree Analysis (FTA), this paper conducts a qualitative and quantities evaluation of PV panel aging related to operating constraints. In this context, an understanding of the several ways that PV panel deteriorates and their mutual relations is carried out. Then, the relationships between the different PV panel aging modes and their causes are presented in the form of an easy-to-understand scheme using FTA. Fuzzy logic is used in conjunction with this FTA to quantify the likelihood of the PV panel degradation may occur. To conclude this reliability analysis, a Pareto chart is created to identify critical causes and provide some corrective measures. The results indicated that implementing of fuzzy FTA and Pareto chart, can ensure a thorough and accurate evaluation of the PV panel aging associated with operational limitations. Additionally, recommending corrective measures for the critical causes can reduce the occurrence probability of PV panel degradation. 

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Published
2025/04/24
Section
Original Scientific Paper